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Pinto N, DiCarlo JJ, Cox DD. How far can you get with a modern face recognition test set using only simple features?. In:  IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops). IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops). Miami, FL: IEEE; 2009. doi:10.1109/CVPR.2009.5206605.\par \par }
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